Characterisation and modification of materials
Structural, electrical and optical characterisation of solids and their interfaces with special emphasis on irradiation and process induced defects
Research Output
Papers in refereed, published conference proceedings
Malherbe JB, Odendaal RQ: 2001. Bombardment-induced topography on semiconductor surfaces. In Proceedings of the International Conference on Fundamental and Applied Aspects of Modern Physics, World Scientific Publishing, pp 201-210. |