Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics
Papers in refereed, published conference proceedings
Nel JM, Gaigher HL, Auret FD: 2002. Microstructural changes in electrodeposited CdS thin films after annealing. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 71-72.
van der Berg NG, Krok F, Odendaal RQ, Malherbe JB, Szymonski M: 2002. Topography on N2+ bombarded InP. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 853-854.
Malherbe JB, van der Berg NG, Odendaal RQ: 2002. Use of AFM in sputter yield measurements on Si0.84Ge0.16 films. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 829-830.
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