Research 2002

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Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics

Odendaal, RQ

BSc(Hons)(Fisika) MSc(Fisika) - Control Technical Assistant

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Research Output

Contact Details:

Telephone number: 012 420 3903
Fax number: 012 362 5288
E-mail address: odendaal@maple.up.ac.za

Research Output:

Papers in refereed, published conference proceedings:

van der Berg NG, Krok F, Odendaal RQ, Malherbe JB, Szymonski M: 2002. Topography on N2+ bombarded InP. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 853-854.

Malherbe JB, van der Berg NG, Odendaal RQ: 2002. Use of AFM in sputter yield measurements on Si0.84Ge0.16 films. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 829-830.

 

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