Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics
Malherbe, JB
MSc DSc(Pret) - Professor and Head
NRF Rating: B2
Contact Details
Research Interests
Research Output
Contact Details:
Telephone number: 012 420 2896
Fax number: 012 362 5288
E-mail address: malherbe@scientia.up.ac.za
Research Interests:
Characterisation and modification of materials
Research Output:
Research articles in refereed specialist journals:
Kunert HW, Malherbe JB, Lavitska E: 2002. Stiffness constants and strain energy densities of fcc and bcc cubic overlayers. Advanced Engineering Materials, 4 (8) / Aug, pp 619-622.
van der Berg NG, Malherbe JB, Odendaal RQ, Goodman SA, Premachandra K: 2002. Argon bombardment-induced topography and sputter yields on Si0.84Ge0.16. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 193, pp 739-744.
Krok F, Kolodziej J, Such B, Piatkowski P, Szymonski M, Odendaal RQ, Malherbe JB: 2002. Low energy ion beam-induced modification of InSb surface studied at nanometric scale. Optica Applicata, 32 (3) / Dec, pp 221-223.
Papers in refereed, published conference proceedings:
van der Berg NG, Krok F, Odendaal RQ, Malherbe JB, Szymonski M: 2002. Topography on N2+ bombarded InP. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 853-854.
Malherbe JB, van der Berg NG, Odendaal RQ: 2002. Use of AFM in sputter yield measurements on Si0.84Ge0.16 films. In Proceedings of the 15th International Congress on Electron Microscopy. Volume 1: Physics and Materials, Microscopy Society of Southern Africa, pp 829-830.
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